发明名称 FLASH MEMORY DEVICE HAVING A DUMMY CELL AND ERASE METHOD THEREOF
摘要 A flash memory device having a dummy cell and an erasing method thereof are provided to minimize read errors by resetting threshold voltages of dummy cells in an optimum level without erase voltage stress. A plurality of memory cells(MC~MC) are formed on a pocket P-well and are serially connected with each other. A plurality of dummy cells(DMC,DMC) are serially connected to the memory cells. A plurality of selection transistors(GST,SST) are serially connected to the dummy cells. A voltage supply unit applies an erase voltage to the pocket P-well. The voltage supply unit applies a first voltage to a word line(WL~WL) of each of memory cells. The voltage supply unit supplies a second voltage higher than the first voltage to dummy lines(DWL,DWL) connected to gates of dummy cells.
申请公布号 KR20090017237(A) 申请公布日期 2009.02.18
申请号 KR20070081830 申请日期 2007.08.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, CHANG HYUN;CHOI, JUNG DAL;CHOE, BYEONG IN
分类号 G11C16/16;G11C16/14 主分类号 G11C16/16
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