发明名称 Free-form optical surface measuring apparatus and method
摘要 A surface measuring apparatus for measuring a surface shape of an element includes a measurement frame having a mount for mounting the element to be measured, a stage including a rotatable device, the stage being movable in at least a first direction relative to the measurement frame, and a contactless distance measurement device for measuring in the first direction a distance between the measurement frame and a predetermined measurement surface provided on the rotatable device. The apparatus further comprises a second distance measurement device for measuring in a second direction a second distance between the device and a selected position on a surface of an element mounted relative to the measurement frame and a rotation measurement device for measuring an angle of rotation between the first and second direction. In this way, aspheric or free-form surfaces of optical elements can be measured easily in closed loop without introducing abbel-errors.
申请公布号 US7492468(B2) 申请公布日期 2009.02.17
申请号 US20060573763 申请日期 2006.06.29
申请人 NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK 发明人 HENSELMANS RENS;ROSIELLE PETRUS CAROLUS JOHANNES NICOLAAS
分类号 G01B11/02;G01B9/02;G01B21/04;G01B21/20 主分类号 G01B11/02
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