| 摘要 |
PROBLEM TO BE SOLVED: To test a function of a high-speed test product using a testing machine with a slow test frequency and to reduce the cost for introducing new equipment. SOLUTION: An apparatus includes a testing machine 1 for testing a test product with a clock frequency lower than that of a test product 3, a high-speed waveform generation section 21 which generates the clock signal having the same clock frequency as that of the test product 3, and a clock signal adjustment section 23 for adjusting a phase of a clock signal generated by the high-speed waveform generation section 21. The clock signal adjustment section 23 compares a phase of a signal from the testing machine 1 with a phase of a clock signal of the high-speed waveform generation section 21, adjusts the clock signal to a specified phase, and inputs the adjusted clock signal to the test product 3 to test the function for the test product 3 using the testing machine 1. COPYRIGHT: (C)2009,JPO&INPIT
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