发明名称 SUBSTRATE TREATING APPARATUS AND TREATING GAS EMITTING MECHANISM
摘要 A film forming apparatus includes a process chamber 2 configured to accommodate a semiconductor wafer W; a worktable 5 disposed inside the process chamber 2 and configured to place the semiconductor wafer W thereon; a showerhead 40 used as a process gas delivery mechanism disposed to face the worktable 5 and configured to delivery a process gas into the process chamber 2; and an exhaust unit 101 configured to exhaust gas from inside the process chamber 2, wherein the showerhead 40 has a gas passage formed therein for supplying the process gas, and an annular temperature adjusting cell 400 formed therein around the gas passage.
申请公布号 US2009038548(A1) 申请公布日期 2009.02.12
申请号 US20070162132 申请日期 2007.03.30
申请人 TOKYO ELECTRON LIMITED 发明人 IIZUKA HACHISHIRO;SAKODA TOMOYUKI;ODA NAOFUMI;TSUJI NORIHIKO;MOROI MASAYUKI
分类号 C23C16/455 主分类号 C23C16/455
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