| 发明名称 |
Method for testing micro SD devices using test circuits |
| 摘要 |
A method and apparatus for testing micro SD devices each having a plurality of electrical leads is described. The method and apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time.
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| 申请公布号 |
US7489156(B2) |
申请公布日期 |
2009.02.10 |
| 申请号 |
US20070786780 |
申请日期 |
2007.04.12 |
| 申请人 |
CHRUMA ATE INC. |
发明人 |
HOPKINS JAMES E.;COSTELLO MICHAEL PETER;TSAI HERBERT;CHEN CHING-TOO |
| 分类号 |
G01R31/26;G01R31/02 |
主分类号 |
G01R31/26 |
| 代理机构 |
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