发明名称 Memory having a vertical transistor
摘要 Structures and fabrication methods for a memory are provided. The memory includes an array of memory cells, where each memory cell has a pillar extending outwardly from a substrate. The pillar includes a first contact layer and a second contact layer separated by an insulating layer. A transistor is formed along side of the pillar. A plurality of buried bit lines are formed of semiconductor material and disposed below the pillars in the array memory cells to interconnect the first contact layer of column adjacent pillars in the array of memory cells. In an embodiment, each word line of a plurality of word lines is disposed orthogonally to the plurality of buried bit lines in a trench between rows of the pillars to address gates of the transistors that are adjacent to the trench.
申请公布号 US7489002(B2) 申请公布日期 2009.02.10
申请号 US20050059723 申请日期 2005.02.16
申请人 MICRON TECHNOLOGY, INC. 发明人 FORBES LEONARD;AHN KIE Y.
分类号 H01L21/8234;H01L27/108;H01L21/336;H01L21/8242;H01L27/088;H01L29/76;H01L29/78;H01L29/786;H01L29/94;H01L31/119 主分类号 H01L21/8234
代理机构 代理人
主权项
地址