发明名称 LUMINANCE NONUNIFORMITY MEASUREMENT METHOD FOR UNIFORM LIGHT SOURCE
摘要 PROBLEM TO BE SOLVED: To provide a method for displaying and measuring the value of a uneveness of luminance, such as brightness with regard to shading of the luminance due to the aberrations of a lens applied to an image processor. SOLUTION: A basic measurement field angle is divided into four measurement event field angles. The measurement event field angle is divided into four portions from a peripheral section, and the total quantity or an average of pixel data corresponding to the field angle is obtained at each divided position. Additionally, the total quantity or an average, corresponding to a quarter of the same field angle, is obtained at the same field angle as a rotated measurement event field angle is rotated at an angle of 180°at the center of the quarter of the field angle. Alternatively, the ratio of the correlation of the total quantity or the average becomes the measured values of the nonuniformity of the measurement event field angle. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009025078(A) 申请公布日期 2009.02.05
申请号 JP20070186854 申请日期 2007.07.18
申请人 MATSUZAKI AYAKO;UZAWA KOYU 发明人 MATSUZAKI AYAKO
分类号 G01J1/42 主分类号 G01J1/42
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