发明名称 |
Adjustment method, exposure method, device manufacturing method, and exposure apparatus |
摘要 |
<p>An adjustment method for adjusting an illumination condition in illuminating an original plate (30) using an illumination optical system (20) and projecting an image of a pattern formed on the original plate onto a substrate (50) through a projection optical system (40) includes measuring a polarization state of light that has passed through the illumination optical system, the original plate, and the projection optical system in a state where the original plate is located on an object plane of the projection optical system, and adjusting the polarization state based on the measured polarization state.</p> |
申请公布号 |
EP2020620(A2) |
申请公布日期 |
2009.02.04 |
申请号 |
EP20080161469 |
申请日期 |
2008.07.30 |
申请人 |
CANON KABUSHIKI KAISHA |
发明人 |
SHINODA, KEN-ICHIRO |
分类号 |
G03F7/20;G01J4/00;G01J4/04 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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