发明名称 Adjustment method, exposure method, device manufacturing method, and exposure apparatus
摘要 <p>An adjustment method for adjusting an illumination condition in illuminating an original plate (30) using an illumination optical system (20) and projecting an image of a pattern formed on the original plate onto a substrate (50) through a projection optical system (40) includes measuring a polarization state of light that has passed through the illumination optical system, the original plate, and the projection optical system in a state where the original plate is located on an object plane of the projection optical system, and adjusting the polarization state based on the measured polarization state.</p>
申请公布号 EP2020620(A2) 申请公布日期 2009.02.04
申请号 EP20080161469 申请日期 2008.07.30
申请人 CANON KABUSHIKI KAISHA 发明人 SHINODA, KEN-ICHIRO
分类号 G03F7/20;G01J4/00;G01J4/04 主分类号 G03F7/20
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