发明名称 PHOTORESIST STRIPPING CHAMBER AND METHODS OF ETCHING PHOTORESIST ON SUBSTRATES
摘要 Methods of processing a substrate so as to protect an active area include positioning a substrate in an inductively coupled plasma processing chamber, supplying process gas to the chamber, generating plasma from the process gas and processing the substrate so as to protect the active area by maintaining a plasma potential of about 5 to 15 volts at the substrate surface and/or passivating the active area by using a siliane-free process gas including at least one additive effective to form a protective layer on the active area of the substrate wherein the protective layer includes at least one element from the additive which is already present in the active area.
申请公布号 KR20090012355(A) 申请公布日期 2009.02.03
申请号 KR20087030186 申请日期 2008.12.10
申请人 LAM RESEARCH CORPORATION 发明人 CHEBI ROBERT P.;WINNICZEK JAROSLAW W.;MILLER ALAN J.;LO GLADYS S.
分类号 H01L21/3065;H05H1/24 主分类号 H01L21/3065
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