发明名称 |
Test unit usable with a board having an electronic component |
摘要 |
A test unit usable with a board having, an electronic component includes at least one testing point provided in each electronic component to test electric properties and a connection state of the plurality of electronic components connected to the board. The test unit usable with a PCB having the electronic component includes a testing point formed on the electronic component, thereby an enhancing high integration of the board.
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申请公布号 |
US7486091(B2) |
申请公布日期 |
2009.02.03 |
申请号 |
US20050316930 |
申请日期 |
2005.12.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK TAE-SANG;KIM JUNG-SOON;MOON YOUNG-JUN;LEE JUN-YOUNG |
分类号 |
G01R31/02 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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