发明名称 Test unit usable with a board having an electronic component
摘要 A test unit usable with a board having, an electronic component includes at least one testing point provided in each electronic component to test electric properties and a connection state of the plurality of electronic components connected to the board. The test unit usable with a PCB having the electronic component includes a testing point formed on the electronic component, thereby an enhancing high integration of the board.
申请公布号 US7486091(B2) 申请公布日期 2009.02.03
申请号 US20050316930 申请日期 2005.12.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK TAE-SANG;KIM JUNG-SOON;MOON YOUNG-JUN;LEE JUN-YOUNG
分类号 G01R31/02 主分类号 G01R31/02
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