发明名称 BOBBIN TYPE EDDY CURRENT PROBE
摘要 A bobbin type eddy current probe is provided to expand lifetime of the device by preventing the damage of coil due to the sleeve in spite of insertion. A bobbin type eddy current probe includes a probe head unit(110), a cable section(120) and signal processing unit(130). The cable supplies current to the probe head unit, the signal processing unit converts the information received from the probe head unit into the digital signal. The probe head unit comprises a body(111), a coil(114) and the sleeve(115), and the cable is inserted into the penetration hole of the body. The coil is combined with the outer circumference of the body in direction perpendicular to the penetration hole. The sleeve protects the coil from outside, and the protrusion is formed in the body into insertion and lead-out direction of the cable.
申请公布号 KR20090011720(A) 申请公布日期 2009.02.02
申请号 KR20070075592 申请日期 2007.07.27
申请人 KOREA ELECTRIC POWER CORPORATION 发明人 JUNG, JEE HONG;NAM, MIN WOO;LEE, HEE JONG;JEE, DONG HYUN;AN, HONG JUN
分类号 G21C17/022;G21C17/00 主分类号 G21C17/022
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