METHOD AND DEVICE FOR DETERMINING SEMICONDUCTOR THICKNESS AND RESISTIVITY,申请号CAD673218-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	METHOD AND DEVICE FOR DETERMINING SEMICONDUCTOR THICKNESS AND RESISTIVITY
摘要
申请公布号	CA673218(A)	申请公布日期	1963.10.29
申请号	CAD673218	申请日期
申请人	WESTERN ELECTRIC COMPANY, INCORPORATED	发明人	JAMES R. SEIFERT;LEON T. STARK;GEORGE L. ALLERTON
分类号		主分类号
代理机构		代理人
主权项
地址

您可能感兴趣的专利

FORMULATING INGREDIENT FOR TREATING PEPTIC ULCER

ADJUSTMENT OF PH OF SWIMMING POOL WATER

FREMGANGSMAADE OG APPARAT TIL FREMBRINGELSE AF PERFORERINGER I EN ROERFORMET BANE AF PLASTFOLIE

DEVICE FOR THE DEACTIVATION AND RE-ACTIOVATION OF TEXTILE APPARATUS,MORE ESPECIALLY A TWO-FOR-ONE SPINNING SPINDLE OR TWO-FOR-ONE TWISTING SPINDLE

A METHOD OF PRODUCING GASES CONTAINING CO AND H2 IN A REACTOR

ELECTRICAL INITIATION OF EXPLOSIONS

DEMPNING AV SNABBA STROMNINGAR I METALLSMELTOR

ANIMAL EXCREMENT FERMENTED FERTILIZER

MANUFACTURE OF PHOTOCONDUCTIVE CADMIUM SULFOSELENIDE

METHOD OF REDUCING ROCK PHOSPHATE

APPARATUS FOR CONCENTRATING AND SEPARATING HYDROGEN OR HELIUM BY MEANS OF POROUS GLASS FILM

ORNAMENTAL SURFACE

FILM-SHEET LAMINATE

MANUFACTURE OF LIGHT TRANSPARENT MATERIAL

SETTER FOR REINFORCING CAGE

SPUTTERING METHOD

SORTER WITH AUTOMATIC EXTRACTOR

ELECTROLYTE FOR ELECTROLYTIC CONDENSER