发明名称 SEMICONDUCTOR ON GLASS INSULATOR MADE USING IMPROVED THINNING PROCESS
摘要 Methods and apparatus for producing a semiconductor on glass (SiOG) structure include: subjecting an implantation surface of a donor semiconductor wafer to an ion implantation process to create an exfoliation layer in the donor semiconductor wafer; bonding the implantation surface of the exfoliation layer to a glass substrate using electrolysis; separating the exfoliation layer from the donor semiconductor wafer, thereby exposing at least one cleaved surface; and subjecting the at least one cleaved surface to a wet etching process.
申请公布号 KR20090009887(A) 申请公布日期 2009.01.23
申请号 KR20087028385 申请日期 2008.11.20
申请人 CORNING INCORPORATED 发明人 FENG JIANGWEI;GADKAREE KISHOR P.;MACH JOSEPH F.;MOORE MICHAEL J.;STOCKER MARK A.
分类号 H01L21/20 主分类号 H01L21/20
代理机构 代理人
主权项
地址