发明名称 Fault detection circuit for a driver circuit
摘要 Various component parts of a driver circuit for drive sources such as electric motors and clutches, such as relays and FETs as well as the drive sources can be tested by selectively energizing the relays and evaluating the voltage levels of the selected points by using the first and second test voltage detection circuits. This testing process is typically executed before the power up of the drive circuit. The test current is so small that the drive sources would not be inadvertently activated and various components would not be damaged even when there is any faulty component in the driver circuit. When any faulty component is detected in the testing process, the driver circuit may be prevented from being powered up so that any undesired operation of the drive sources or permanent damage to various components owing to such a faulty component may be avoided.
申请公布号 US7218120(B2) 申请公布日期 2007.05.15
申请号 US20050094329 申请日期 2005.03.30
申请人 MITSUBA CORPORATION 发明人 SHIMOYAMA MIKIHITO;KAWAKURA TAKAYUKI;OGAWA TOMOYUKI;SHIGA NAOHIKO;YANAGITA YUICHI;TANINO KATSUHIRO
分类号 G01R31/08;G01R31/40;H02K17/32;H02K23/68;H02K27/30;H02P1/04;H02P7/00 主分类号 G01R31/08
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