TRANSISTOR WITH DIFFERENTLY DOPED STRAINED CURRENT ELECTRODE REGION

摘要

A transistor is formed by providing a semiconductor layer (103) and forming a control electrode (105) overlying the semiconductor layer. A portion of the semiconductor layer is removed lateral to the control electrode to form a first recess (201) and a second recess (203) on opposing sides of the control electrode. A first stressor (301) is formed within the first recess and has a first doping profile. A second stressor (303) is formed within the second recess and has the first doping profile. A third stressor (401) is formed overlying the first stressor. The third stressor has a second doping profile that has a higher electrode current doping concentration than the first profile. A fourth stressor (403) overlying the second stressor is formed and has the second doping profile. A first current electrode and a second current electrode of the transistor include at least a portion of the third stressor and the fourth stressor, respectively.