发明名称 Method for finding specific pattern and method for compensating image offset
摘要 A method for finding a specific pattern is used to find a specific pattern in an image to be tested. The method comprises the following steps of: acquiring an image to be tested; performing a binary thresholding process on the image to be tested, thereby transforming the image to be tested into a binary image; performing a mosaic process on the binary image, thereby transforming the binary image into a mosaic image; utilizing a correlation coefficient method to find the specific pattern most similar to an image template from the mosaic image, wherein the image template is a desired mosaic pattern of the specific pattern; and transforming the mosaic image back into the binary image so as to find the coordinate of the specific pattern accurately.
申请公布号 US2009022406(A1) 申请公布日期 2009.01.22
申请号 US20080219282 申请日期 2008.07.18
申请人 ASUSTEK COMPUTER INC. 发明人 CHANG CHUNG-HWA;SU HSIN-CHING
分类号 G06K9/68 主分类号 G06K9/68
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