发明名称 CALIBRATING DEVICE FOR ARRAY TYPE MAGNETIC FLAW DETECTION EQUIPMENT, AND CALIBRATION METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a calibration device for array type magnetic flaw detection equipment capable of calibrating easily sensitivity of an individual magnetic sensor for a micro-fine defect of a running thin steel sheet, in the array type magnetic-field test equipment, and a calibration method therefor. SOLUTION: This calibration device for the array type magnetic flaw detection equipment includes a calibrating sample sheet 2 provided with a conductor 2a wound linearly by one round on a nonmagnetic substance plate, a sample support block 3 lifted off by a prescribed amount with respect to a magnetosensitive face of the magnetic sensor and provided with a moving mechanism for regulating finely a position of the calibrating sample sheet along a moving direction of the thin steel plate on a plane in parallel to the magnetosensitive face, and a pulse current generator 4 for making a pulse current flow in the conductor, and the detection sensitivity of the magnetic sensor is calibrated by making the pulse current flow in the conductor, and by applying a pulse magnetic field to the magnetic sensor. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009014678(A) 申请公布日期 2009.01.22
申请号 JP20070179997 申请日期 2007.07.09
申请人 TOSHIBA CORP 发明人 WATANABE YOSHINORI
分类号 G01N27/83 主分类号 G01N27/83
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