发明名称 Solid-state timing device using a floating-gate transistor
摘要 <p>An aging device according to an embodiment of the present invention includes a semiconductor substrate (11), first and second diffusion layers (11A, 11B) provided in a first element region (AA1), a floating gate (14) provided above a channel region between the first and second diffusion layers (11A, 11B), and a control gate electrode (16) provided beside the floating gate (14) with an interval in the lateral direction. A coupling capacitance between the floating gate (14) and the control gate electrode (16) is larger than a coupling capacitance between the floating gate (14) and the semiconductor substrate (11).</p>
申请公布号 EP2017880(A2) 申请公布日期 2009.01.21
申请号 EP20080160605 申请日期 2008.07.17
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 WATANABE, HIROSHI;KINOSHITA, ATSUHIRO;KOBAYASHI, SHIGEKI;HAGISHIMA, DAISUKE
分类号 H01L21/336;G04F10/10;G04F13/00;G11C16/04;H01L21/8247;H01L29/423;H01L29/788 主分类号 H01L21/336
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