发明名称 METHOD AND APPARATUS FOR EXAMINING ION-CONDUCTIVE ELECTROLYTE MEMBRANE
摘要 A detection membrane (11) is bonded to a first surface (10a) of an electr olyte membrane (10), and a hydrogen gas is supplied to a second surface (10b ) side of the electrolyte membrane (10). When the electrolyte membrane (10) has a defect portion (10c), the hydrogen gas is leaked to the first surface (10a), resulting in a change in electric resistance of the detection membran e (11) near the defect portion (10c). Whether or not a defect portion is pre sent is determined based on the change in the electric resistance. Further, a hydrogen electrode (14) is bonded to the second surface (10b) of the elect rolyte membrane (10), and an electric circuit (17) is connected to between t he detection membrane (11) and the hydrogen electrode (14). The hydrogen gas supplied to a space on the hydrogen electrode (14) side is ionized by the h ydrogen electrode (14). The hydrogen ion is passed through the electrolyte m embrane (10) and hydrogenates the detection membrane (11). The electric resi stance of the detection membrane (11), which varies depending upon the amoun t of hydrogen ion, is measured for each of a plurality of regions to examine the uniformity of hydrogen ion conductivity.
申请公布号 CA2691986(A1) 申请公布日期 2009.01.15
申请号 CA20082691986 申请日期 2008.07.03
申请人 KABUSHIKI KAISHA ATSUMITEC 发明人 UCHIYAMA, NAOKI
分类号 G01N27/20;H01M8/02;H01M8/04;H01M8/10 主分类号 G01N27/20
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