发明名称 METHOD OF FORMING GROUP-III NITRIDE CRYSTAL, LAYERED STRUCTURE AND EPITAXIAL SUBSTRATE
摘要 Heat treatment is conducted at a predetermined temperature of not less than 1250° C. on an underlying substrate obtained by epitaxially forming a first group-III nitride crystal on a predetermined base as an underlying layer. Three-dimensional fine irregularities resulting from crystalline islands are created on the surface of the underlying layer. A second group-III nitride crystal is epitaxially formed on the underlying substrate as a crystal layer. There are a great many fine voids interposed at the interface between the crystal layer and underlying substrate. The presence of such voids suppresses propagation of dislocations from the underlying substrate, which reduces the dislocation density in the crystal layer. As a result, the crystal layer of good crystal quality can be obtained.
申请公布号 US2009017333(A1) 申请公布日期 2009.01.15
申请号 US20080234022 申请日期 2008.09.19
申请人 NGK INSULATORS, LTD.;DOWA MINING CO., LTD. 发明人 SHIBATA TOMOHIKO
分类号 B32B9/00;H01L23/48 主分类号 B32B9/00
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