发明名称 FET gate structure and fabrication process
摘要 The invention includes a method of fabricating a gate structure for a field effect transistor and the gate structure. The method includes providing a crystalline silicon substrate and epitaxially growing a gate insulating layer of crystalline rare earth insulating material on the crystalline silicon substrate. A gate stack of crystalline silicon is then epitaxially grown on the layer of crystalline rare earth insulating material and doped to provide a desired type of conductivity. The gate insulating layer and the gate stack are etched and a metal electrical contact is deposited on the epitaxially grown gate stack of crystalline silicon to define a gate structure.
申请公布号 US7476600(B1) 申请公布日期 2009.01.13
申请号 US20060595242 申请日期 2006.11.09
申请人 TRANSLUCENT, INC. 发明人 ATANACKOVIC PETAR B.
分类号 H01L21/00 主分类号 H01L21/00
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