发明名称 |
Verfahren zum Herstellen eines Halbleiter-bauelements, wie Halbleiterstromtor oder Flaechentransistor, mit einer hochohmigen n-Zone zwischen zwei p-Zonen im Halbleiter-koerper |
摘要 |
1,007,598. Semi-conductor devices. SIEMENS-SCHUCKERTWERKE A.G. March 28, 1962 [March 29, 19611, No. 11945/62. Heading H1K. A PNP semi-conductor device in a sealed housing has the N-type zone in contact with a substance on a small portion of the surface which acts electropositively so as to induce negative charges on the surface of the N-zone and so prevent any tendency for a shortcircuiting P-type channel to form. The substance may be in the form of a lacquer such as a silicone modified terephthalic ester resin, or the surrounding space in the enclosure may contain ammonia in aqueous or gaseous form. Alternatively, a lacquer comprising 20% of alizarin may be used. Fig. 4 shows a semiconductor device comprising an N-type body la with P-type layers 16<SP>1</SP> and 161<SP>1</SP> and a further N-type layer under electrode 2 so that the arrangement provides a PNPN device which may be used as a transistor or semi-conductor thyratron. The body is contained in a sealed housing with an electropositive substance as described so that short-circuiting across the exposed surface of N-type 1a is avoided. The semi-conductor material may be silicon, germanium or an A III B V compound. |
申请公布号 |
DE1182353(B) |
申请公布日期 |
1964.11.26 |
申请号 |
DE1961S073228 |
申请日期 |
1961.03.29 |
申请人 |
SIEMENS-SCHUCKERTWERKE AKTIENGESELLSCHAFT |
发明人 |
BERNUTH DIPL.-PHYS. GOETZ VON;JAENTSCH DR. RER. NAT. OTTMAR;KROCKOW DIETER |
分类号 |
H01L23/16;H01L23/29;H01L23/31;H01L29/00 |
主分类号 |
H01L23/16 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|