发明名称 Bitline of semiconductor device having stud type capping layer and method for fabricating the same
摘要 A semiconductor device with a bitline structure has a stud type capping layer. A method of fabricating the same achieves sufficient process margins and reduces parasitic capacitance. The device may include an insulating film formed on a semiconductor substrate and having a bitline contact and a groove-shaped bitline pattern, a bitline formed on the bitline contact and on a portion of the bitline pattern and that is surrounded by the insulating film, and a bitline capping layer formed on the bitline within the bitline pattern and the insulating film that protrudes from the insulating film. A protruded portion of the bitline capping layer is wider than a width of the bitline.
申请公布号 US7473954(B2) 申请公布日期 2009.01.06
申请号 US20050249097 申请日期 2005.10.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEONG MUN-MO;LEE CHANG-HUHN;YOSHIDA MAKOTO
分类号 H01L21/8242;H01L29/94;H01L21/3205;H01L21/768;H01L23/52;H01L23/522;H01L27/105;H01L27/108;H01L29/40 主分类号 H01L21/8242
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