发明名称 Adjustable resolution interferometric lithography system
摘要 A lithographic system includes a source of a laser beam; a beamsplitter dividing the laser beam into a plurality of beams; and a plurality of reflecting surfaces that forms interference fringes on a substrate using the plurality of beams. Resolution of the lithographic system is adjustable by adjusting angular orientation of the reflecting surfaces. The beamsplitter is movable along the optical path to adjust the resolution. The reflecting surfaces may be facets of a prism. Each reflecting surface corresponds to a particular beamsplitter position along the optical path, and/or to a particular resolution. The beamsplitter includes a linear grating or a checkerboard grating. The beams are N-way symmetric. A numerical aperture of the system is adjustable by moving the beamsplitter along the optical path. A liquid can be between the substrate and the prism.
申请公布号 US7474385(B2) 申请公布日期 2009.01.06
申请号 US20060561238 申请日期 2006.11.17
申请人 ASML HOLDING N.V. 发明人 MARKOYA LOUIS;KHMELICHEK ALEKSANDR;SEWELL HARRY
分类号 G03B27/54;G03B27/52 主分类号 G03B27/54
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