发明名称 |
TEMPERATURE MEASUREMENT USING CHANGES IN DIELECTRIC CONSTANT AND ASSOCIATED RESONANCE |
摘要 |
<p>A temperature measurement technique for calculating a temperature in a high temperature environment by monitoring a change in resonant frequency of a resonant structure loaded with a dielectric material. A response curve for a reflection coefficient S11 associated with the resonant structure is generated, typically by the use of a network analyzer connected to the resonant structure via a cable. A minimum point for the response curve is identified to detect the resonant frequency for the resonant structure. A calibration map is applied to the minimum point to identify a temperature associated with the resonant frequency of the resonant structure. The temperature associated with the resonant frequency of the resonant structure represents the temperature of the high temperature environment.</p> |
申请公布号 |
EP2008069(A2) |
申请公布日期 |
2008.12.31 |
申请号 |
EP20070755512 |
申请日期 |
2007.04.13 |
申请人 |
RADATEC, INC. |
发明人 |
BILLINGTON, SCOTT;GEISHEIMER, JONATHAN;HOLST, THOMAS |
分类号 |
G01K7/32;G01K11/00 |
主分类号 |
G01K7/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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