发明名称 Power IGBT with increased robustness
摘要 A power IGBT includes a semiconductor body having an emitter zone of a first conduction type and a drift zone of a second conduction type proximate to the emitter zone. The IGBT further includes a cell array, each transistor cell of the array having a source zone, a body zone disposed between the source zone and the drift zone, the body zone and source zone short-circuited, and a gate electrode configured to be insulated with respect to the source zone and the body zone. The cell array has a first cell array section with a first cell density and a second cell array section with a second cell density that is lower than the first cell density. The emitter zone has a lower emitter efficiency in a region corresponding to the second cell array section than in a region corresponding to the first cell array section.
申请公布号 US7470952(B2) 申请公布日期 2008.12.30
申请号 US20060598243 申请日期 2006.11.09
申请人 INFINEON TECHNOLOGIES AG 发明人 RUETHING HOLGER;SCHULZE HANS-JOACHIM;PFAFFENLEHNER MANFRED
分类号 H01L29/76 主分类号 H01L29/76
代理机构 代理人
主权项
地址