发明名称 Temperature compensated self-refresh circuit
摘要 A temperature compensated self-refresh circuit maintains a stable current characteristic by maintaining a predetermined self-refresh cycle to cope with a process skew and a voltage change in a low power consumption memory product and by changing the self-refresh cycle only depending on temperature change. The temperature compensated self-refresh circuit is provided with a reference voltage generating unit adapted and configured to use an internal power voltage of a Widlar type so as to reduce a process skew and to have NMOS transistors with a LVT (Low Voltage Transistor) structure so as to have the same voltage as that of a temperature sense unit, thereby maintaining a predetermined cycle of an oscillating signal coping with the process skew.
申请公布号 US7471136(B2) 申请公布日期 2008.12.30
申请号 US20050148562 申请日期 2005.06.09
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HONG YUN SEOK
分类号 H01L35/00;H01L37/00;H03K3/42 主分类号 H01L35/00
代理机构 代理人
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