发明名称 P-DOPED REGION WITH IMPROVED ABRUPTNESS
摘要 A method of manufacturing a semiconductor device. The method comprises providing C atoms in a semiconductor substrate. The method also comprises implanting In atoms and p-type dopants into a predefined region of the substrate that is configured to have the carbon atoms. The method further comprises thermally annealing the semiconductor substrate to transform the predefined region into an activated doped region.
申请公布号 US2008308904(A1) 申请公布日期 2008.12.18
申请号 US20070763497 申请日期 2007.06.15
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 CHIDAMBARAM P. R.;CHAKRAVARTHI SRINIVASAN;NANDAKUMAR MAHALINGAM;MEHROTRA MANOJ;JAIN AMITABH;BONIFIELD THOMAS D.
分类号 H01L21/425;H01L29/36 主分类号 H01L21/425
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