首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
摘要
申请公布号
JPS54120251(U)
申请公布日期
1979.08.23
申请号
JP19780015653U
申请日期
1978.02.13
申请人
发明人
分类号
F24F11/02;F24F11/00;(IPC1-7):F24F11/00
主分类号
F24F11/02
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Testing system for testing semiconductor package stacking chips and semiconductor automatic tester thereof
Semiconductor test structures
System and method for automated testing of an electric cable harness
Power analysis module for monitoring an electrical power source
Current sensor
Method, apparatus and system for providing metering of acceleration
Sample processing method, device and system for an assembly line workstation
Methods for diagnosing and treating an LGI1 related autoimmune disease
Early detection of diabetes
Use of micropatterned soft substrate for measuring of cell traction forces
System for preventing undue bending of cables
CMM with flaw detection system
Graphene sensor
Method for analysing amino acids and a reagent for use with the same
Raman spectrum measuring method for drug inspection
Identifying potential fracture treatment locations in a formation based on production potential
Kit for performing adhesive audits and a method for doing the same
Bush component force detection device
Dual capacitor load cell
System and method for combined microwave heating and radiometry for characterizing biological tissues