发明名称 MAKING OF FINE STRUCTURE WITH DIMENSIONAL STABILITY
摘要 <p>A method for manufacturing structures having dimensions in a range of 1 mu m and below in a layer of material by applying an auxiliary layer consisting of metal or metal oxide on the layer to be structured and utilizing a lacquer mask to structure the auxiliary layer to form a mass therein for the etching of the layer to be structured, characterized by passivating the auxiliary layer by applying a protective layer to prevent oxidizing of the auxiliary layer until a desired time. The protective layer can be gold or platinum and the auxiliary layer can be selected from a group consisting of titanium, hafnium, zirconium, vanadium, chromium, manganese, aluminum, niobium and tantalum. The method is particularly useful to manufacuture absorber structures of X-ray masks that are used in microelectronics.</p>
申请公布号 JPS6057343(A) 申请公布日期 1985.04.03
申请号 JP19840155115 申请日期 1984.07.25
申请人 SIEMENS SCHUCKERTWERKE AG 发明人 BURIGITSUTE SHIYUNAIDAAGUMERUHI;YOOZEFU MATSUUNI
分类号 G03F1/22;H01L21/027 主分类号 G03F1/22
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