发明名称 APPARATUS FOR MEASURING VICINAL ELECTRIC FIELD
摘要 PURPOSE:To make it possible to measure the radiation directionality of an antenna to be measured having an aperture larger than a probe scanning range with good accuracy, by making it possible to rotate a probe using a crank shaped wave guide over a range of 360 deg. in a scanning plane. CONSTITUTION:In such a state that a crank shaped probe 44 is placed to the left side of a scanning frame being a point coincided with the edge of the aperture of an antenna 41 to be measured, a current is supplied to an antenna 41 to be measured from a transmitter 40 and the probe 44 is allowed to scan from below to an upward direction. The output of the probe 44 is inputted to a receiver 48 and the amplitude and phase of the vicinal electric field at each measuring point are measured. Next, a scanning guide 46 is moved by each interval between samples present in the long axis direction to succeed the same measurement and, when the probe 4 moves to the right side of the scanning frame, the probe 4 is rotated by 180 deg. by a rotary apparatus 45 to repeat the same measurement. By this method, measurement up to 1.5 times the aperture can be performed even if the long axis direction of the antenna 41 to be measured and the remote field directionality of the antenna 41 to be measured can be measured with high accuracy.
申请公布号 JPS60256071(A) 申请公布日期 1985.12.17
申请号 JP19840110917 申请日期 1984.06.01
申请人 TOSHIBA KK 发明人 IWASAKI HISAO;HIDAKA KAZUTAKA
分类号 G01R29/10 主分类号 G01R29/10
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