发明名称 TEST METHOD FOR INCANDESCENT LAMP TYPE FLUORESCENT LAMP
摘要 PURPOSE:To detect anode oscillation of bulb voltage waveform and measure operating condition of glow lamp from waveform observation obtained by placing in contact a voltage probe of oscilloscope to the case of incandescent lamp type fluorescent lamp. CONSTITUTION:An incandescent lamp type fluorescent lamp consisting of a luminous bulb 1, a ballast 2, a glow lamp 3, a noise elimination capacitor 4, a lamp base 5 and a case 6 is caused to light, a voltage probe 8 of oscilloscope 9 is in contact with the case 6 and wave form of the induced voltage at this time is observed with an oscilloscope 9. It is detected whether there is anode oscillation in the bulb voltage waveform or not from waveform and it is also detected whether there is residual glow of glow lamp or not for the performance test of the incandescent lamp type fluorescent lamp. Accordingly, measurement can be done easily within a short period without taking out the connecting lead to the outside.
申请公布号 JPS61142632(A) 申请公布日期 1986.06.30
申请号 JP19840262774 申请日期 1984.12.14
申请人 HITACHI LTD 发明人 KUROSAWA TOSHIAKI
分类号 H01J9/42;(IPC1-7):H01J9/42 主分类号 H01J9/42
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