发明名称 |
Monitor for particles of various materials |
摘要 |
A monitor for particles of various materials which counts the number of the particles on real-time and in situ basis. The monitor comprises a unit for illuminating an object to be inspected with an illumination light beam of a predetermined cross-sectional area, a unit for detecting a change in optical mode of the illumination light beam caused by the particles being contained in the inspected object and illuminated with the illumination light beam, the illuminating and detecting units being of a unitary structure, and a unit for counting an amount of the particles contained in the inspected object by using a change in intensity of an optically mode changed light beam.
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申请公布号 |
US4827143(A) |
申请公布日期 |
1989.05.02 |
申请号 |
US19870030436 |
申请日期 |
1987.03.26 |
申请人 |
HITACHI, LTD. |
发明人 |
MUNAKATA, CHUSUKE;ITOH, YOSHITOSHI |
分类号 |
G01N15/02;G01N15/14;G01N21/51;G01N21/64;G01N21/94;(IPC1-7):G01N15/06 |
主分类号 |
G01N15/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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