| 摘要 |
There is provided a method for manufacturing a semiconductor device, which includes the steps of: providing a semiconductor substrate including a gate, a source and a drain, wherein the gate includes a gate dielectric layer disposed on the semiconductor substrate; forming an etching barrier layer on the semiconductor substrate; and subjecting the resulted structure to hydrogen annealing. According to the present invention, the interface energy level between a gate dielectric layer and a semiconductor substrate is lowered and the reliability of the semiconductor device is improved.
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