发明名称 Systems and methods for measuring temperature
摘要 Systems and methods for determining a temperature sensitivity of a MEMS device are disclosed. An exemplary method includes determining a temperature response of a MEMS device at an arbitrary temperature and calibrating the MEMS device based on the temperature response.
申请公布号 US2008262773(A1) 申请公布日期 2008.10.23
申请号 US20080008147 申请日期 2008.01.08
申请人 EXATRON INC. 发明人 HOWELL ROBERT L.
分类号 G01K15/00 主分类号 G01K15/00
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