发明名称 Method and apparatus for inspecting defects in multiple regions with different parameters
摘要 In a method of inspecting defects, a first actual region of an actual object is inspected based on a first characteristic parameter as an inspection condition. A point where an inspection region of the actual object is changed into a second actual region from the first actual region is determined. The second actual region is then inspected based on a second characteristic parameter as the inspection condition. The first and second parameters may include contrast of a light that is reflected from a reference object, intensity of the light, brightness of the light, a size of a minute structure on the reference object, etc. The characteristic parameters of each reference region on the reference object are set. Thus, the defects may be accurately classified so that a time and a cost for reviewing the defects may be markedly reduced.
申请公布号 US7433032(B2) 申请公布日期 2008.10.07
申请号 US20050253028 申请日期 2005.10.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM JOUNG-SOO;CHON SANG-MUN;JUN CHUNG-SAM;YANG YU-SIN
分类号 G01B15/00;G01N21/00 主分类号 G01B15/00
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