发明名称 SEMICONDUCTOR STORAGE DEVICE
摘要 PROBLEM TO BE SOLVED: To simplify control constitution for changing over a normal operation and a test mode operation; to simplify circuit constitution of a FIFO memory; and to reduce the circuit scale. SOLUTION: When the test mode is set by a control signal S33 of an address controller 33 to establish a mode in which read address data RAD can be externally input, the externally input read address data RAD is temporarily stored in a read address register 34-1, and the data of the read address register 34-1 is copied to a read address counter 20-1 by the control signal S33 of the address controller 33, so that it can be used as the start address. Namely, when data read is requested, an arbitrarily word line WL and start positions of read column decoders 32-1, 32-2 are designated by setting the externally input read address data RAD in the read address counter 20-1. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008198298(A) 申请公布日期 2008.08.28
申请号 JP20070033651 申请日期 2007.02.14
申请人 OKI ELECTRIC IND CO LTD 发明人 HIRAOKA TERUMI
分类号 G11C29/12;G11C7/00;G11C11/401 主分类号 G11C29/12
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