发明名称 PHOTOMASK AND PATTERN-FORMING METHOD USING THE PHOTOMASK
摘要 <P>PROBLEM TO BE SOLVED: To provide a photomask which can prevent a size of a pattern, which is formed on a photosensitive material, from varying due to a local flare, and also to provide a pattern-forming method using the photomask. <P>SOLUTION: A main pattern light shielding part 1, which transfers a pattern to a photosensitive material, is formed on the photomask. The area of the photomask except the part, in which at least the main pattern light shielding part 1 is formed, is composed of a semi transparent part 3. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008197439(A) 申请公布日期 2008.08.28
申请号 JP20070033329 申请日期 2007.02.14
申请人 ELPIDA MEMORY INC 发明人 YOSHINO HIROSHI
分类号 G03F1/32;G03F1/68;H01L21/027 主分类号 G03F1/32
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