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发明名称
Testverfahren für Halbleiter-Speicherschaltung
摘要
申请公布号
DE60227624(D1)
申请公布日期
2008.08.28
申请号
DE20026027624
申请日期
2002.04.22
申请人
FUJITSU LTD.
发明人
YAMAZAKI, MASAFUMI;SUZUKI, TAKAAKI;NAKAMURA, TOSHIKAZU;ETO, SATOSHI;MIYO, TOSHIYA;SATO, AYAKO;YONEDA, TAKAYUKI;KAWAMURA, NORIKO
分类号
G11C29/00;G11C29/36;G11C29/48
主分类号
G11C29/00
代理机构
代理人
主权项
地址
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