发明名称 BLANK MASK AND MANUFACTURING METHOD OF PHOTO-MASK USING THE SAME
摘要 <p>A blank mask and a method of manufacturing a photo-mask using the same are provided to implement a thin photoresist by stacking a hard mask layer before photoresist coating. A blank mask includes a transparent substrate(1), a light shielding film(3), an anti-reflection coating(4), a hard mask film(5), and a photoresist(6). The light shielding film is stacked on the transparent substrate. The anti-reflection coating is stacked on the light shielding film. The hard mask film is stacked on the anti-reflection coating. The photoresist is coated on the hard mask film. The hard mask film has the same etching characteristic as the light shielding film and different etching characteristic from the anti-reflection coating.</p>
申请公布号 KR20080078789(A) 申请公布日期 2008.08.28
申请号 KR20080069799 申请日期 2008.07.18
申请人 S&STECH CO., LTD. 发明人 NAM, KEE SOO;CHA, HAN SUN
分类号 H01L21/027 主分类号 H01L21/027
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