发明名称 AL-based alloy sputtering target and process for producing the same
摘要 <p>The present invention relates to an Al-based alloy sputtering target, comprising Ni in an amount of 0.05 to 10 atomic percent, wherein the Al-based alloy sputtering target satisfies: (1) that a ratio of a P value to a total area of a sputtering surface is 70% or more, wherein the P value indicates a total of area fractions of <001> ± 15°, <011> ± 15°, <111> ± 15° and <311> ± 15°; (2) that a ratio of the area fraction of <011> ± 15° to the P value is 30% or more; and (3) that a ratio of the area fraction of <111> ± 15° to the P value is 10% or less, when crystallographic orientations <001>, <011>, <111> and <311> in a normal line direction to a sputtering surface of the Al-based alloy sputtering target are observed in accordance with the electron backscatter diffraction pattern method.</p>
申请公布号 EP1932940(A1) 申请公布日期 2008.06.18
申请号 EP20070022151 申请日期 2007.11.14
申请人 KABUSHIKI KAISHA KOBE SEIKO SHO;KOBELCO RESEARCH INSTITUTE , INC. 发明人 TAKAGI, KATSUTOSHI;EHIRA, MASAYA;KUGIMIYA, TOSHIHIRO;YONEDA, YOICHIRO;GOTOU, HIROSHI
分类号 C23C14/34;C22C21/00 主分类号 C23C14/34
代理机构 代理人
主权项
地址