发明名称 Integrated clock generator tolerant to device parameter variation
摘要 A method and circuit for stabilizing a frequency of a clock generator comprising a ring oscillator with respect to manufacturing process variations and a circuit temperature. A bias circuit comprising a current mirror and cascade circuits provides a compensated bias current based on a gate source voltage and drain source voltage of an output transistor, where the two voltages are independent of transistor parameters and circuit temperature. As a result, the ring oscillator frequency is stabilized with respect to those parameters.
申请公布号 US7388447(B1) 申请公布日期 2008.06.17
申请号 US20060472652 申请日期 2006.06.21
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 POTANIN VLADISLAV;POTANINA ELENA
分类号 H03B27/00 主分类号 H03B27/00
代理机构 代理人
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