| 摘要 |
The invention relates to a device for examining workpieces (6), in particular, circuit cards, comprising an examination tool, which is clamped to the measuring head (2), which can be displaced in relation to the workpiece (6) on a workpiece plane, and also comprising an optical observation device which is used to control the measuring head (2). The optical observation device is embodied as a camera (5), which is mounted on the measuring head (2) and which comprises an optical axis (5a), such that a simple, rapid and reliable measurement can be carried out. Said axis is essentially perpendicular to the workpiece plane (6a), and a calibration device is provided in order to determine the mechanical offset (d) which is the distance of the tool (3) from the optical axis (5a) of the camera (5). The invention also relates to a method which can be carried out using the above-mentioned device.
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