发明名称 |
FLASH MEMORY DEVICE AND METHOD FOR SENSING CHANNEL BOOSTING LEVEL |
摘要 |
A flash memory device for measuring a channel boosting voltage and a method thereof are provided to measure the channel boosting voltage in a floating node state accurately, in case of global self boosting and local boosting. A cell string(102) includes a plurality of cells. A channel selection part(106) performs a function of selecting at least one channel among channels of the cell string. A sensing current measurement part(108) performs a function of measuring a current in the program operation condition of the channel selected by the channel selection part, among the channels of the cell string. A reference voltage/current measurement part(104) performs a function of measuring a voltage or a current in the reference condition of the channel selected by the channel selection part, among the channels of the cell string.
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申请公布号 |
KR20080053567(A) |
申请公布日期 |
2008.06.16 |
申请号 |
KR20060125276 |
申请日期 |
2006.12.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, BYUNG YONG;LEE, CHOONG HO;PARK, KYU CHARN |
分类号 |
G11C16/30;G11C16/04 |
主分类号 |
G11C16/30 |
代理机构 |
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地址 |
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