发明名称 FLASH MEMORY DEVICE AND METHOD FOR SENSING CHANNEL BOOSTING LEVEL
摘要 A flash memory device for measuring a channel boosting voltage and a method thereof are provided to measure the channel boosting voltage in a floating node state accurately, in case of global self boosting and local boosting. A cell string(102) includes a plurality of cells. A channel selection part(106) performs a function of selecting at least one channel among channels of the cell string. A sensing current measurement part(108) performs a function of measuring a current in the program operation condition of the channel selected by the channel selection part, among the channels of the cell string. A reference voltage/current measurement part(104) performs a function of measuring a voltage or a current in the reference condition of the channel selected by the channel selection part, among the channels of the cell string.
申请公布号 KR20080053567(A) 申请公布日期 2008.06.16
申请号 KR20060125276 申请日期 2006.12.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, BYUNG YONG;LEE, CHOONG HO;PARK, KYU CHARN
分类号 G11C16/30;G11C16/04 主分类号 G11C16/30
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