| 摘要 |
A memory controller added with a self-test function and a method using the same are provided to test quickly a memory by feeding back data and a data timing signal of the memory controller and test quickly a DDR(Dual Data Rate) memory by feeding back the data and a strobe signal of the memory controller. A test controller(410) generates test data in a test mode. A data transmitter(420) generates a data read timing signal, and outputs the data read timing signal and the test data synchronized with the data read timing signal. A data I/O(Input/Output) part(430) feeds back the test data and the data read timing signal to the data transmitter. The data transmitter restores the feedback test data based on the feedback data read timing signal. The test controller compares the generated test data with the restored test data. If an operation mode is a non-test mode, the data transmitter outputs the data write timing signal and the data synchronized with a data write timing signal. The data transmitter includes a data timing block(427) generating/outputting the data read timing signal and a data write block(425) outputting the data read timing signal and the test data synchronized with the data read timing signal. |
