发明名称 |
LOW POWER TESTING OF VERY LARGE CIRCUITS |
摘要 |
Plural scan test paths ( 401 ) are provided to reduce power consumed during testing such as combinational logic ( 101 ). A state machine ( 408 ) operates according to plural shift states ( 500 ) to control each scan path in capturing data from response outputs of the combinational logic and then shifting one bit at a time to reduce the capacitive and constant state power consumed by shifting the scan paths. |
申请公布号 |
US2007113130(A1) |
申请公布日期 |
2007.05.17 |
申请号 |
US20060560128 |
申请日期 |
2006.11.15 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
WHETSEL LEE D. |
分类号 |
G01R31/28;G01R31/317;G01R31/3185 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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