发明名称 GAIN MEASURING STRUCTURE
摘要 PROBLEM TO BE SOLVED: To provide an enhanced apparatus and method for measuring gains. SOLUTION: A CCD device of the type for providing charge gain by impact ionization has a multiplication register. Gains provided by a subset of the elements of the multiplication register are independently controllable from other elements in the register. This enables the register to be used in one setting with the same gain applied to all elements and a different setting with a subset of elements arranged to provide a different gain. By comparing the two signals, the gain provided by the register can be derived. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007124675(A) 申请公布日期 2007.05.17
申请号 JP20060314835 申请日期 2006.10.24
申请人 E2V TECHNOLOGIES (UK) LTD 发明人 ROBBINS MARK S
分类号 H01L27/148;H04N5/335;H04N5/372 主分类号 H01L27/148
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