发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To control each carrier mobility individually in two or more kinds of MOS transistors formed on the same semiconductor substrate. SOLUTION: A channel region of two kinds of MOS transistors having gate oxide films of different thickness is formed in the main surface of a semiconductor substrate. Subsequently, roughness is formed on the surface of the semiconductor substrate by a first cleaning processing. After forming an oxide film on the surface of the semiconductor by a first oxidization and nitriding treated substrate, oxide films other than a predetermined region are removed so that a thick film of gate oxide may be formed. Subsequently, roughness is formed on the surface of the semiconductor substrate by a second cleaning processing. After forming an oxide film on the surface of the semiconductor substrate by a second oxidization and nitriding treatment, oxide films other than a predetermined region are removed so that a thin film of gate oxide may be formed. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007123490(A) 申请公布日期 2007.05.17
申请号 JP20050312662 申请日期 2005.10.27
申请人 RENESAS TECHNOLOGY CORP 发明人 KOIDE MASAKI;SHIMIZU AKIHIRO;HIRAIWA ATSUSHI
分类号 H01L21/8234;H01L21/304;H01L27/088 主分类号 H01L21/8234
代理机构 代理人
主权项
地址