发明名称 SEMICONDUCTOR MEMORY DEVICE AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor memory device having a memory cell capable of improving a static noise margin (SNM) when a reading/writing operation. SOLUTION: The device includes a NMOS transistor N4 of which the gate is connected to a first node of a flip-flop, a NMOS transistor N6 of which the gate is connected to a second node of a flip-flop, a transfer gate N3 of which the one end of the current path is connected to one end of the current path of the NMOS transistor N4, a transfer gate N5 of which the one end of the current path is connected to one end of the current path of the NMOS transistor N6, and a pair of bit lines. Further, the device includes a diode D2 of which an anode is connected to the first node of the flip-flop and the cathode is connected to one end of the current path of the transfer gate N5, and a diode D1 of which an anode is connected to the second node of the flip-flop and the cathode is connected to one end of the current path of the transfer gate N3. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007122818(A) 申请公布日期 2007.05.17
申请号 JP20050314714 申请日期 2005.10.28
申请人 TOSHIBA CORP 发明人 OTSUKA NOBUAKI
分类号 G11C11/412;H01L21/8244;H01L27/11;H01L29/786 主分类号 G11C11/412
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