发明名称 Method and apparatus for detecting defects using focus compensation
摘要 A method and apparatus for detecting a defect in an article that causes deflection of a beam when the beam strikes the defect. A beam used for detecting defects may be directed across at least a portion of the article. The distance traveled by the beam changes as the beam is directed across the article. The beam is focused correspondingly with the changing distance traveled by the beam.
申请公布号 US2007109539(A1) 申请公布日期 2007.05.17
申请号 US20050280791 申请日期 2005.11.16
申请人 DAMER LEWIS S;KOPCHINSKI JAMES M 发明人 DAMER LEWIS S.;KOPCHINSKI JAMES M.
分类号 G01N21/84 主分类号 G01N21/84
代理机构 代理人
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